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Electronic structure of the organic metals {kappa}-ET{sub 2}Cu(SCN){sub 2} and {kappa}-ET{sub 2}Cu[N(CN){sub 2}]Br measured by soft X-ray emission and soft X-ray absorption

Conference ·
OSTI ID:20034119
The electronic structure of the two organic, layered metals {kappa}-ET{sub 2}Cu(SCN){sub 2} and {kappa}-ET{sub 2}Cu[N(CN){sub 2}]Br has been studied using a combination of soft X-ray emission (SXE) and soft X-ray absorption (SXA) spectroscopy. These techniques are powerful probes of the site and angular-momentum resolved partial density of states (PDOS) for both occupied and unoccupied states. Therefore these spectroscopies are particularly suited for an analysis of the density of states of multi-atomic, complex materials as the ET-based organic conductors, allowing site-specific electronic structure to be measured. Furthermore, for certain materials, the electronic structure of specific layers can be measured. The authors present a preliminary picture of the electronic structure of {kappa}-ET{sub 2}Cu(SCN){sub 2} and {kappa}-ET{sub 2}Cu[N(CN){sub 2}]Br as measured by SXE and SXA performed at the C-1s and N-1s core levels.
Research Organization:
Boston Univ., MA (US)
Sponsoring Organization:
National Science Foundation; US Department of Energy; Swedish Natural Research Council
OSTI ID:
20034119
Country of Publication:
United States
Language:
English