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Title: Comparison of ion-beam irradiation effects in X{sub 2}YO{sub 4} compounds

Journal Article · · Journal of the American Ceramic Society
OSTI ID:20005960

The effects of 1.5 MeV Kr-ion irradiation on seven X{sub 2}YO{sub 4} phases with the olivine (A{sub 2}{sup VI}B{sup IV}O{sub 4}), spinel (A{sup IV}B{sub 2}{sup VI}O{sub 4}), and phenakite structures have been investigated using in situ and high-resolution transmission electron microscopy (HRTEM) over a wide temperature range (20--873 K). At low temperatures ({lt}200 K), the olivine and phenakite are susceptible to radiation-induced amorphization with a critical amorphization dose of 0.2--0.5 displacement per atom (dpa). The critical amorphization dose increases with increasing irradiation temperature at varying rates for the various phases, resulting in a distinct critical amorphization temperature for each phase. For the Mg-Fe series of olivine, the susceptibility to amorphization at higher temperatures (room temperature or above) increases with increasing Fe content. Although the spinel phases are, in general, much more resistant to amorphization, a high-pressure metastable spinel phase, {gamma}-SiFe{sub 2}O{sub 4}, is easily amorphized at doses {lt}0.2 dpa at temperatures below 723 K. This phase decomposes after irradiation at 873 K. At 20 K, complete amorphization of the FeCr{sub 2}O{sub 4} spinel (chromite) is achieved at {approximately}4 dpa, but no evidence of amorphization is observed in MgAl{sub 2}O{sub 4} spinel after 5.4 dpa. The distinct differences in the relative susceptibility of these phases to amorphization are discussed in terms of the structural and chemical controls on the amorphization process.

Research Organization:
Univ. of Michigan, Ann Arbor, MI (US)
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-97ER45656
OSTI ID:
20005960
Journal Information:
Journal of the American Ceramic Society, Vol. 82, Issue 12; Conference: 100th Annual Meeting of the American Ceramic Society, Cincinnati, OH (US), 05/05/1998--05/06/1998; Other Information: PBD: Dec 1999; ISSN 0002-7820
Country of Publication:
United States
Language:
English