Direct atomic-scale imaging of ceramic interfaces
Understanding the atomic structure and chemistry of internal interfaces is often critical to developing interface structure-property relationships. Results are presented from several studies in which Z-contrast scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) have been employed to solve the atomic structures of oxide interfaces. The Z-contrast imaging technique directly reveals the projected cation sublattices constituting the interface, while EELS provides chemical and local electronic structure information. Because Z-contrast imaging and EELS can be performed simultaneously, direct correlations between structure and chemistry can be made at the atomic scale. The utility of Z-contrast imaging and EELS is demonstrated in three examples: A ZrO{sub 2} 24{degree} [100] symmetric tilt grain boundary, a NiO-cubic ZrO{sub 2} eutectic interface and a Ni-cubic ZrO{sub 2} metal-ceramic interface. The power and versatility of Z-contrast and EELS for solving interface structures in oxide systems is clearly demonstrated in these three material systems.
- Research Organization:
- Univ. of Kentucky, Lexington, KY (US)
- Sponsoring Organization:
- US Department of Energy
- OSTI ID:
- 20005383
- Journal Information:
- Acta Materialia, Journal Name: Acta Materialia Journal Issue: 15-16 Vol. 47; ISSN 1359-6454; ISSN ACMAFD
- Country of Publication:
- United States
- Language:
- English
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