An XPS study of the interaction of ultrathin Cu films with Pd(111)

Journal Article · Thu Oct 07 04:00:00 EDT 1999 · Journal of Physical Chemistry B: Materials, Surfaces, Interfaces, amp Biophysical

DOI:https://doi.org/10.1021/jp991843j· OSTI ID:20001145

Liu, G; Clair, T P; Goodman, D W

The interaction of ultrathin Cu films with Pd(111) was studied by X-ray photoelectron spectroscopy (XPS). The effects of Cu coverage and annealing temperature were investigated. The XPS data show that at room temperature Cu grows on Pd(111) layer-by-layer without alloying. Furthermore, Cu 2p{sub 3/2}core-level shifts as a function of film thickness indicate that the Cu-Pd interactions perturb the electronic properties of two to three layers of Cu atoms. The Cu 2p{sub 3/2} binding energy of a Cu monolayer at room temperature was shifted by {minus}0.47 eV relative to a Cu(100) surface. XPS core-level shifts demonstrate that by annealing to temperatures higher than 450 K the Cu overlayer alloys with the Pd substrate. After annealing to 900 K, the Cu 2p{sub 3/2} binding energy for 1.0 ML Cu coverage was observed to shift {minus}0.49 eV relative to that of 1 ML Cu/Pd(111). The XPS binding energy shifts are discussed in terms of both initial and final state effects.

• Research Organization: Texas A and M Univ., College Station, TX (US)
• Sponsoring Organization: US Department of Energy
• OSTI ID: 20001145
• Journal Information: Journal of Physical Chemistry B: Materials, Surfaces, Interfaces, amp Biophysical, Journal Name: Journal of Physical Chemistry B: Materials, Surfaces, Interfaces, amp Biophysical Journal Issue: 40 Vol. 103; ISSN 1089-5647; ISSN JPCBFK
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
40 CHEMISTRY
CATALYSTS
COPPER
INTERACTIONS
PALLADIUM
THIN FILMS
X-RAY SPECTROSCOPY