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Title: Effects of segregated sulfur on recrystallization texture and magnetic induction in thin-gauged 3% silicon steel

Abstract

During final annealing at 1200 C under a high vacuum, changes in recrystallization texture with final annealing time were observed in thin-gauged 3% Si-Fe alloys. In the alloy containing 30 ppm bulk sulfur, the recrystallization texture varied from the {l{underscore}brace}111{r{underscore}brace} to the {l{underscore}brace}001{r{underscore}brace} and finally to the {l{underscore}brace}110{r{underscore}brace} < 001 > Goss texture, resulting in higher magnetic induction than 1.90 T. The trough in magnetic induction, which corresponds to the relatively high surface-segregated sulfur range, is due to the magnetically detrimental effect of those textures, i.e., the {l{underscore}brace}111{r{underscore}brace} and the {l{underscore}brace}011{r{underscore}brace} . In the alloy containing 6 ppm bulk sulfur, the correlation between magnetic induction and surface-segregated sulfur was the same as that in the other alloy. These results clearly indicate that the surface energy induced recrystallization in the thin-gauged 3% Si-Fe alloys is strongly affected by the segregation and the evaporation of sulfur.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Korea Inst. of Science and Technology, Sungbuk, Seoul (KR)
OSTI Identifier:
20000777
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers)
Additional Journal Information:
Journal Volume: 35; Journal Issue: 5Pt2; Conference: 1999 international magnetics conference (Intermag '99), Kyongju (KR), 05/18/1999--05/21/1999; Other Information: PBD: Sep 1999; Journal ID: ISSN 0018-9464
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; LOW ALLOY STEELS; SILICON ALLOYS; RECRYSTALLIZATION; TEXTURE; SULFUR ADDITIONS; METALLURGICAL EFFECTS; INDUCTION; ANNEALING; MAGNETIC PROPERTIES

Citation Formats

Chai, K.H., Heo, N.H., Na, J.G., Jeong, H.T., and Lee, S.R. Effects of segregated sulfur on recrystallization texture and magnetic induction in thin-gauged 3% silicon steel. United States: N. p., 1999. Web. doi:10.1109/20.800528.
Chai, K.H., Heo, N.H., Na, J.G., Jeong, H.T., & Lee, S.R. Effects of segregated sulfur on recrystallization texture and magnetic induction in thin-gauged 3% silicon steel. United States. doi:10.1109/20.800528.
Chai, K.H., Heo, N.H., Na, J.G., Jeong, H.T., and Lee, S.R. Wed . "Effects of segregated sulfur on recrystallization texture and magnetic induction in thin-gauged 3% silicon steel". United States. doi:10.1109/20.800528.
@article{osti_20000777,
title = {Effects of segregated sulfur on recrystallization texture and magnetic induction in thin-gauged 3% silicon steel},
author = {Chai, K.H. and Heo, N.H. and Na, J.G. and Jeong, H.T. and Lee, S.R.},
abstractNote = {During final annealing at 1200 C under a high vacuum, changes in recrystallization texture with final annealing time were observed in thin-gauged 3% Si-Fe alloys. In the alloy containing 30 ppm bulk sulfur, the recrystallization texture varied from the {l{underscore}brace}111{r{underscore}brace} to the {l{underscore}brace}001{r{underscore}brace} and finally to the {l{underscore}brace}110{r{underscore}brace} < 001 > Goss texture, resulting in higher magnetic induction than 1.90 T. The trough in magnetic induction, which corresponds to the relatively high surface-segregated sulfur range, is due to the magnetically detrimental effect of those textures, i.e., the {l{underscore}brace}111{r{underscore}brace} and the {l{underscore}brace}011{r{underscore}brace} . In the alloy containing 6 ppm bulk sulfur, the correlation between magnetic induction and surface-segregated sulfur was the same as that in the other alloy. These results clearly indicate that the surface energy induced recrystallization in the thin-gauged 3% Si-Fe alloys is strongly affected by the segregation and the evaporation of sulfur.},
doi = {10.1109/20.800528},
journal = {IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers)},
issn = {0018-9464},
number = 5Pt2,
volume = 35,
place = {United States},
year = {1999},
month = {9}
}