Raman spectroscopic characterization of SiO2 phase transformation and Si substrate stress relevant to EBC performance

Lance, Michael J.; Ridley, Mackenzie J.; Kane, Kenneth A.; Pint, Bruce A.

doi:10.1111/jace.19190

Raman spectroscopic characterization of SiO₂ phase transformation and Si substrate stress relevant to EBC performance

Journal Article · Wed May 10 00:00:00 EDT 2023 · Journal of the American Ceramic Society

DOI:https://doi.org/10.1111/jace.19190· OSTI ID:1999072

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Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Johns Hopkins University, Laurel, MD (United States)

To accurately model the long-term durability of environmental barrier coatings (EBCs), a more complete understanding of the phase composition and transformations of the thermally grown oxide SiO₂ (TGO) is desired. For the TGO formed during thermal cycling in steam, cristobalite formation and the subsequent β- to α-cristobalite transformation has been identified as a potentially life-limiting mechanism. In this study, Raman micro-spectroscopy was used to quantify the cristobalite transformation on a polycrystalline Si coupon that was exposed to steam at 1350°C for 100 h. The phase transformation was mapped at 200–260°C on the TGO surface at different ramp rates using a heating stage and a micro-positioning stage. The stress in the Si substrate was also determined using Raman spectroscopy by measuring the stress induced peak shift. The α→β phase transformation produced a 300–500 MPa tensile stress in the Si substrate, which compared well to the stress predicted from the volumetric expansion of the cristobalite. In conclusion, quantifying the phase transformation and residual stress are critical tools in developing the next generation of high performance EBCs.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Fossil Energy and Carbon Management (FECM)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1999072

Journal Information:: Journal of the American Ceramic Society, Journal Name: Journal of the American Ceramic Society Journal Issue: 10 Vol. 106; ISSN 0002-7820

Publisher:: American Ceramic SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
Raman spectroscopy
environmental barrier coatings
phase transformation
silica/SiO2

Raman spectroscopic characterization of SiO2 phase transformation and Si substrate stress relevant to EBC performance

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References (24)

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Raman spectroscopic characterization of SiO₂ phase transformation and Si substrate stress relevant to EBC performance