Significant Reduction in Field Emission on Niobium Surfaces after GCIB Treatments
Field emission is one of the major obstacles for achieving constantly high accelerating gradient for Nb superconducting radio frequency (SRF) cavities, although various techniques and procedures have been adopted trying to keep the inner surfaces of Nb SRF cavities clean and free from field emission in the past a couple of decades. In this report, it is shown that significant reductions in field emission on Nb surfaces can be achieved by means of a new surface treatment technique called gas cluster ion beam (GCIB). When a relevant treatment agent is selected with optimal treating parameters, it is demonstrated a reduction in field emission as much as 87.5% is possible through measurements using a home-made scanning field emission microscope. Possible mechanism regarding the suppression of field emission on Nb surfaces by GCIB treatments will be discussed.
- Research Organization:
- Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Nuclear Physics (NP)
- DOE Contract Number:
- AC05-06OR23177
- OSTI ID:
- 1998853
- Report Number(s):
- JLAB-ACC-09-1088; DOE/OR/23177-1113
- Resource Relation:
- Conference: SRF2009, Berlin, Germany, September 20, 2009
- Country of Publication:
- United States
- Language:
- English
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