Nonlocal subpicosecond delay metrology using spectral quantum interference
- Purdue Univ., West Lafayette, IN (United States)
- Purdue Univ., West Lafayette, IN (United States); SRI International, Arlington, VA (United States)
- Purdue Univ., West Lafayette, IN (United States); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- National Inst. of Standards and Technology (NIST), Boulder, CO (United States)
Precise knowledge of position and timing information is critical to support elementary protocols such as entanglement swapping on quantum networks. While approaches have been devised to use quantum light for such metrology, they largely rely on time-of-flight (ToF) measurements with single-photon detectors and, therefore, are limited to picosecond-scale resolution owing to detector jitter. In this work, we demonstrate an approach to distributed sensing that leverages phase modulation to map changes in the spectral phase to coincidence probability, thereby overcoming the limits imposed by single-photon detection. By extracting information about the joint biphoton phase, we measure a generalized delay—the difference in signal–idler arrival, relative to local radio frequency (RF) phase modulation. For nonlocal ranging measurements, we achieve (2$$σ$$) precision of ±0.04 ps and for measurements of the relative RF phase, (2$$σ$$) precision of ±0.7°. We complement this fine timing information with ToF data from single-photon time-tagging to demonstrate absolute measurement of time delay. By relying on off-the-shelf telecommunications equipment and standard quantum resources, this approach has the potential to reduce overhead in practical quantum networks.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- National Science Foundation (NSF); USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR)
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1997644
- Journal Information:
- Optica, Journal Name: Optica Journal Issue: 12 Vol. 9; ISSN 2334-2536
- Publisher:
- Optical Society of AmericaCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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