Differential single-electron capture cross sections in low-energy Ar{sup q+} (q=4-8) ions - He and Ar collisions

Conference · Sat Dec 31 04:00:00 EST 1994

OSTI ID:199639

Edens, J; Kamber, E Y; Akguengoer, K ^[1]

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1. Western Michigan Univ., Kalamazoo, MI (United States); and others

Differential cross sections for single-electron capture by Ar{sup q+} ions (q = 4-8) from He and Ar have been measured at impact energies between 600 and 2500 eV, and projectile scattering angles between 0 and 25 mrad. The ions were produced in a recoil ion source by using 25 MeV F{sup +} ions from WMU tandem Van de Graaff accelerator as a pump beam. The ions were extracted at right angles to the pump beam direction, charge analyzed by the magnet, and passed through the target collision cell. Charge state selection was done with an electrostatic retarding grid located in front of the one-dimensional position-sensitive channel plate detector. The detector was collimated with a bow-tie shaped aperture to convert the radial distribution to an approximately linear one. The experimental angular distributions contain a main peak lying near a critical angle ({theta}{sub c}), which corresponds to capture at an impact parameter equal to the crossing radius. The results will be quantitatively explained by a semi-classical model based on Coulomb potentials.

• OSTI ID: 199639
• Report Number(s): CONF-941129--
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ARGON
ARGON IONS
DIFFERENTIAL CROSS SECTIONS
ELECTRON CAPTURE
HELIUM
ION-ATOM COLLISIONS