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Characterization of Quantum Frequency Processors

Journal Article · · IEEE Journal of Selected Topics in Quantum Electronics
 [1];  [1];  [2];  [3]
  1. Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
  2. Purdue University, West Lafayette, IN (United States)
  3. Arizona State University, Tempe, AZ (United States); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Frequency-bin qubits possess unique synergies with wavelength-multiplexed lightwave communications, suggesting valuable opportunities for quantum networking with the existing fiber-optic infrastructure. Although the coherent manipulation of frequency-bin states requires highly controllable multi-spectral-mode interference, the quantum frequency processor (QFP) provides a scalable path for gate synthesis leveraging standard telecom components. Here, we summarize the state of the art in experimental QFP characterization. Distinguishing between physically motivated “open box” approaches that treat the QFP as a multiport interferometer, and “black box” approaches that view the QFP as a general quantum operation, we highlight the assumptions and results of multiple techniques, including quantum process tomography of a tunable beamsplitter—to our knowledge the first full process tomography of any frequency-bin operation. Our findings should inform future characterization efforts as the QFP increasingly moves beyond proof-of-principle tabletop demonstrations toward integrated devices and deployed quantum networking experiments.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR); National Science Foundation; Air Force Research Laboratory
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1986227
Journal Information:
IEEE Journal of Selected Topics in Quantum Electronics, Journal Name: IEEE Journal of Selected Topics in Quantum Electronics Journal Issue: 6: Photonic Signal Processing Vol. 29; ISSN 1077-260X
Publisher:
IEEE Lasers and Electro-optics SocietyCopyright Statement
Country of Publication:
United States
Language:
English

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Figures / Tables (7)