skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Efficiency and Forward Voltage of Blue and Green Lateral LEDs with V-shaped Defects and Random Alloy Fluctuation in Quantum Wells

Journal Article · · Physical Review Applied
 [1];  [2];  [3]; ORCiD logo [4]
  1. National Taiwan University, Taipei (Taiwan)
  2. University of California, Santa Barbara, CA (United States)
  3. University of California, Santa Barbara, CA (United States); Centre de Recherche en Gestion - Ecole Polytechnique / CNRS, Palaiseau (France)
  4. National Taiwan University, Taipei (Taiwan); Industrial Technology Research Laboratories, Hsinchu (Taiwan)

For nitride-based blue and green light-emitting diodes (LEDs), the forward voltage Vfor is larger than expected, especially for green LEDs. This is mainly due to the large barriers to vertical carrier transport caused by the total polarization discontinuity at multiple quantum well and quantum barrier interfaces. The natural random alloy fluctuation in quantum wells has proven to be an important factor reducing Vfor. However, this does not suffice in the case of green LEDs because of their larger polarization-induced barrier. V-shaped defects (V-defects) have been proposed as another key factor in reducing Vfor to allow lateral injection into multiple quantum wells, thus bypassing the multiple energy barriers incurred by vertical transport. In this paper, to model carrier transport in the whole LED, we consider both random-alloy and V-defect effects. A fully two-dimensional drift-diffusion charge-control solver is used to model both effects. The results indicate that the turn-on voltages for blue and green LEDs are both affected by random alloy fluctuations and the V-defect density. For green LEDs, Vfor decreases more due to V-defects, where the smaller polarization barrier at the V-defect sidewall is the major path for lateral carrier injection. Then, we discuss how the V-defect density and size affects the results.

Research Organization:
Univ. of California, Santa Barbara, CA (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE); Ministry of Science and Technology, Taiwan; National Science Foundation (NSF); Simons Foundation; French Agence Nationale de la Re-cherche (ANR)
Grant/Contract Number:
EE0009691; MOST 108-2628-E-002- 010-MY3; MOST 110-2923-E-002-002; MOST 111- 2923-E-002-009; DMS-1839077; 601952; 601954; ANR-20-CE05-0037-01
OSTI ID:
1979642
Journal Information:
Physical Review Applied, Vol. 17, Issue 1; ISSN 2331-7019
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English

References (43)

Universal mechanism for Anderson and weak localization journal August 2012
Modeling dislocation-related leakage currents in GaN p-n diodes journal December 2019
Effect of quantum well cap layer thickness on the microstructure and performance of InGaN/GaN solar cells journal April 2012
Simulating random alloy effects in III-nitride light emitting diodes journal July 2020
3D numerical modeling of the carrier transport and radiative efficiency for InGaN/GaN light emitting diodes with V-shaped pits journal May 2016
Localization landscape theory of disorder in semiconductors. III. Application to carrier transport and recombination in light emitting diodes journal April 2017
Barriers to carrier transport in multiple quantum well nitride-based c -plane green light emitting diodes journal May 2020
Impact of dislocations and defects on the relaxation behavior of InGaN/GaN multiple quantum wells grown on Si and sapphire substrates journal March 2015
Localization landscape theory of disorder in semiconductors. II. Urbach tails of disordered quantum well layers journal April 2017
Structure and formation mechanism of V defects in multiple InGaN∕GaN quantum well layers journal April 2006
Localization landscape theory of disorder in semiconductors. I. Theory and modeling journal April 2017
Carriers capturing of V-defect and its effect on leakage current and electroluminescence in InGaN-based light-emitting diodes journal December 2012
Manipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wells journal March 2015
A 3D simulation comparison of carrier transport in green and blue c-plane multi-quantum well nitride light emitting diodes journal December 2020
Electroluminescence from the sidewall quantum wells in the V-shaped pits of InGaN light emitting diodes journal June 2014
The influence of random indium alloy fluctuations in indium gallium nitride quantum wells on the device behavior journal September 2014
Investigating the Efficiency Droop of Nitride-Based Blue LEDs with Different Quantum Barrier Growth Rates journal December 2019
Three-Dimensional Modeling of Minority-Carrier Lateral Diffusion Length Including Random Alloy Fluctuations in ( In , Ga ) N and ( Al , Ga ) N Single Quantum Wells journal August 2021
Atomic scale characterization of GaInN/GaN multiple quantum wells in V-shaped pits journal May 2011
Rate equation analysis of efficiency droop in InGaN light-emitting diodes journal August 2009
Structural origin of V-defects and correlation with localized excitonic centers in InGaN/GaN multiple quantum wells journal February 1998
Effective Confining Potential of Quantum States in Disordered Media journal February 2016
The effect of nanometre-scale V-pits on electronic and optical properties and efficiency droop of GaN-based green light-emitting diodes journal July 2018
Analysis of defect-related inhomogeneous electroluminescence in InGaN/GaN QW LEDs journal November 2016
Effect of V-pits embedded InGaN/GaN superlattices on optical and electrical properties of GaN-based green light-emitting diodes: Optical and electrical properties of GaN-based green LED journal November 2016
Indirect Auger recombination as a cause of efficiency droop in nitride light-emitting diodes journal April 2011
Dislocation effect on light emission efficiency in gallium nitride journal December 2002
High dislocation densities in high efficiency GaN‐based light‐emitting diodes journal March 1995
Nanoscale Characterization of V-defect in InGaN/GaN QWs LEDs using Near-Field Scanning Optical Microscopy journal April 2019
Nature of V-Shaped Defects in GaN journal May 2013
Strain-induced polarization in wurtzite III-nitride semipolar layers journal July 2006
V-pit pinning at the interface of high and low-temperature gallium nitride growth journal May 2019
Three dimensional simulation on the transport and quantum efficiency of UVC-LEDs with random alloy fluctuations journal October 2018
Role of V-defect density on the performance of III-nitride green LEDs on sapphire substrates journal April 2021
Efficiency Drop in Green InGaN / GaN Light Emitting Diodes: The Role of Random Alloy Fluctuations journal January 2016
Quantum efficiency affected by localized carrier distribution near the V-defect in GaN based quantum well journal December 2013
Efficient InGaN-based yellow-light-emitting diodes journal January 2019
Analyzing the physical properties of InGaN multiple quantum well light emitting diodes from nano scale structure journal August 2012
Effect of V-shaped Pit area ratio on quantum efficiency of blue InGaN/GaN multiple-quantum well light-emitting diodes journal February 2016
Minority carrier diffusion length in GaN: Dislocation density and doping concentration dependence journal January 2005
Theoretical and experimental investigations of vertical hole transport through unipolar AlGaN structures: Impacts of random alloy disorder journal July 2020
Improvement of efficiency and electrical properties using intentionally formed V-shaped pits in InGaN/GaN multiple quantum well light-emitting diodes journal June 2013
Review—On The Search for Efficient Solid State Light Emitters: Past, Present, Future journal January 2020