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Title: Thick target neutron yields from Beryllium, Carbon, Tungsten, and Lead targets irradiated by 26.7 MeV/nucleon 4 H e ions

Journal Article · · Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
ORCiD logo [1];  [1]; ORCiD logo [2];  [1];  [3]; ORCiD logo [1];  [3]; ORCiD logo [1]
  1. Chinese Academy of Sciences (CAS), Lanzhou (China); University of Chinese Academy of Sciences, Beijing (China); Advanced Energy Science and Technology Guangdong Laboratory, Huizhou (China)
  2. Texas A & M University, College Station, TX (United States)
  3. Chinese Academy of Sciences (CAS), Lanzhou (China); Advanced Energy Science and Technology Guangdong Laboratory, Huizhou (China)

The angular and energy distributions of secondary neutrons produced from 26.7 MeV/nucleon 4He ions, stopping in thick Be, C, W and Pb targets are measured by the time of flight method. The GEANT4, PHITS, and FLUKA Monte Carlo simulation codes with different physics models are employed to simulate the neutron yields and the results are compared with the experimental data. For the thick Be and C targets, GEANT4 with INCL++ reproduces the experimental data reasonably well. Whereas PHITS with JQMD-2.0 overestimates the neutron yields at intermediate energies and FLUKA with PEANUT underestimated the neutron yields at intermediate energies. For W and Pb targets, FLUKA with PEANUT physics model agree with experimental data best. PHITS with JQMD-2.0 overestimates the neutron yield at intermediate energies at 0°, and GEANT4 with INCL++ underestimates the neutron yield at intermediate energies at three angles.

Research Organization:
Texas A & M Univ., College Station, TX (United States)
Sponsoring Organization:
USDOE Office of Science (SC); National Natural Science Foundation of China (NSFC)
Grant/Contract Number:
FG02-93ER40773; 11875298; U1832205
OSTI ID:
1977495
Alternate ID(s):
OSTI ID: 1845926
Journal Information:
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms, Vol. 516, Issue C; ISSN 0168-583X
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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