A simple method to characterize the optical properties of textured TCO layers for amorphous silicon solar cell applications

Conference · Sun Dec 31 04:00:00 EST 1995

OSTI ID:197625

Tao, G; Metselaar, J W ^[1]

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1. Delft Univ. of Technology (Netherlands). Dept. of Electronic Componenten, Technology and Materials

It is well known that the light absorption in an amorphous silicon solar cell can be enhanced by applying textured transparent conductive oxide (TCO) substrates. However, the degree of the enhancement depends on the optical and surface properties of the TCO substrates: the refractive index n({lambda}), the extinction coefficient {kappa}({lambda}), the thickness d of the layer and the root mean square (rms) roughness {sigma}{sub r} of the rough surface. Because light scattering takes place at the rough surface, the transmittance spectroscopy can not be directly applied to determine the TCO layer properties. The authors have studied the light scattering at the rough TCO surfaces. Based on their analysis, the reflected and transmitted light at a rough interface consists of a specular part and a diffused part. The specular reflectance and transmittance depend on the optical and surface properties of the TCO layer. The authors have developed a procedure to extract the optical and surface properties from the measured specular reflectance and transmittance.

• OSTI ID: 197625
• Report Number(s): CONF-950793--; ISBN 0-8194-1890-0
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
CALCULATION METHODS
LIGHT TRANSMISSION
OPTICAL PROPERTIES
SILICON SOLAR CELLS
SUBSTRATES
SURFACE PROPERTIES