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Achieving extreme light confinement in low-index dielectric resonators through quasi-bound states in the continuum

Journal Article · · Optics Letters
DOI:https://doi.org/10.1364/ol.445411· OSTI ID:1968729
 [1];  [2]
  1. Argonne National Lab. (ANL), Lemont, IL (United States); Univ. of Chicago, IL (United States)
  2. Argonne National Lab. (ANL), Lemont, IL (United States); Univ. of Chicago, IL (United States); Northwestern Univ., Evanston, IL (United States)
Obtaining large field enhancement in low-refractive-index dielectric materials is highly relevant to many photonic and quantum optics applications. However, confining light in these materials is challenging, owing to light leakage through coupling to continuum modes in the surrounding environment. Here, we investigate the possibility of achieving high quality factors in low-index dielectric resonators through the bound states in the continuum (BIC). Our simulations demonstrate that destructive interference between leaky modes can be achieved by tuning the geometrical parameters of the resonator arrays, leading to the emergence of quasi-BIC in resonators that have a small index contrast to the underlying substrates. The resultant large field enhancement gives rise to giant quality factors and Purcell effects. By introducing vertical mirror symmetry, the quasi-BIC can be tuned into an ideal BIC. In addition, the quasi-BIC can modify the emission patterns of the coupled emitters, rendering highly directional and focused far-field emission. These findings may provide a path for the practical implementation of photonic and quantum devices based on low-index dielectric materials.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
National Science Foundation (NSF); USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1968729
Alternate ID(s):
OSTI ID: 1835654
Journal Information:
Optics Letters, Journal Name: Optics Letters Journal Issue: 24 Vol. 46; ISSN 0146-9592
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English

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