Thickness-Dependent Cross-Plane Thermal Conductivity Measurements of Exfoliated Hexagonal Boron Nitride

Jaffe, Gabriel R.; Smith, Keenan J.; Watanabe, Kenji; Taniguchi, Takashi; Lagally, Max G.; Eriksson, Mark A.; Brar, Victor W.

doi:10.1021/acsami.2c21306

Thickness-Dependent Cross-Plane Thermal Conductivity Measurements of Exfoliated Hexagonal Boron Nitride

Journal Article · Sun Feb 26 23:00:00 EST 2023 · ACS Applied Materials and Interfaces

DOI:https://doi.org/10.1021/acsami.2c21306· OSTI ID:1958926

^[1]; Smith, Keenan J. ^[1]; ^[2]; ^[3]; Lagally, Max G. ^[4]; Eriksson, Mark A. ^[1]; Brar, Victor W. ^[1]

Department of Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States
Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States

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Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: FG02-03ER46028; SC0020313

OSTI ID:: 1958926

Alternate ID(s):: OSTI ID: 1960362

Journal Information:: ACS Applied Materials and Interfaces, Journal Name: ACS Applied Materials and Interfaces Journal Issue: 9 Vol. 15; ISSN 1944-8244

Publisher:: American Chemical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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