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Title: Selectively patterned Mg-doped GaN by SiNx-driven hydrogen injection

Journal Article · · Journal of Vacuum Science and Technology B
DOI:https://doi.org/10.1116/6.0002029· OSTI ID:1958026

In this work, we demonstrate a method to achieve selectively patterned Mg-doped GaN layers using hydrogen drive-in through plasma-enhanced chemical vapor deposition (PECVD) silicon nitride (SiNx) films. Activated Mg-doped GaN layers were selectively deactivated by patterned PECVD SiNx films with low-temperature annealing and showed high-resistive behavior. Spatially resolved photoluminescence measurements were used to optically verify the deactivation of Mg acceptors and showed distinct features corresponding to activated and deactivated Mg in GaN. The method suggested here provides a simple and effective method to achieve patterned Mg-doped GaN regions without thermal and plasma damage, which could cause degradation of device performance. The proposed method could provide a way to achieve future high-performance GaN lateral and vertical devices that rely on laterally patterned doping.

Research Organization:
Washington State Univ., Pullman, WA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE
Grant/Contract Number:
FG02-07ER46386
OSTI ID:
1958026
Alternate ID(s):
OSTI ID: 1894154
Journal Information:
Journal of Vacuum Science and Technology B, Vol. 40, Issue 6; ISSN 2166-2746
Publisher:
American Vacuum Society / AIPCopyright Statement
Country of Publication:
United States
Language:
English

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