A Method to Probe the Interfaces in La2−xSrxCuO4-LaSrAlO4-La2−xSrxCuO4 Trilayer Junctions

Xu, Xiaotao; He, Xi; Bollinger, Anthony T.; Han, Myung-Geun; Zhu, Yimei; Shi, Xiaoyan; Božović, Ivan

doi:10.3390/condmat8010021

A Method to Probe the Interfaces in La2−xSrxCuO4-LaSrAlO4-La2−xSrxCuO4 Trilayer Junctions

Journal Article · Fri Feb 10 00:00:00 UTC 2023 · Condensed Matter

DOI:https://doi.org/10.3390/condmat8010021· OSTI ID:1924353

; He, Xi; ; Han, Myung-Geun; Zhu, Yimei; ;

C-axis trilayer cuprate Josephson junctions are essential for basic science and digital circuit applications of high-temperature superconductors. We present a method for probing the interface perfection in La2−xSrxCuO4 (LSCO)-LaSrAlO4 (LSAO)-La2−xSrxCuO4 trilayer junctions. A series of LSCO-LSAO superlattices with atomically smooth surfaces and sharp interfaces were grown by the atomic-layer-by-layer molecular beam epitaxy (ALL-MBE) technique. We have systematically varied the thickness of LSCO and LSAO layers with monolayer precision. By studying the mutual inductance and electrical transport in these superlattices, we detect the non-superconducting (“dead”) layers at the interfaces and quantify their thicknesses. Our results indicate that two optimally doped LSCO monolayers just above and below the one monolayer LSAO barrier are no longer superconducting, rendering the actual barrier thickness of five monolayers. Next, we have shown that introducing a protective highly-overdoped LSCO layer reduces the thickness of dead layers by one or two monolayers.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012704

OSTI ID:: 1924353

Alternate ID(s):: OSTI ID: 1958567

Report Number(s):: BNL-224070-2023-JAAM; PII: condmat8010021

Journal Information:: Condensed Matter, Journal Name: Condensed Matter Journal Issue: 1 Vol. 8; ISSN 2410-3896; ISSN CMOAFD

Publisher:: MDPI AGCopyright Statement

Country of Publication:: Switzerland

Language:: English

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