Electrical performances of pre-production staves for the ATLAS ITk Strip Detector Upgrade

Journal Article · Mon Jan 16 23:00:00 EST 2023 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/18/01/c01036· OSTI ID:1923324

Capocasa, F. ^[1]; Gutierrez Zagazeta, L. F. ^[2]; Lynn, D. ^[3]; Phillips, P. W. ^[4]; Stucci, S. A. ^[3]; Tricoli, A. ^[3]; Van Nieuwenhuizen, G. ^[4]

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1. Brandeis Univ., Waltham, MA (United States)
2. Univ. of Pennsylvania, Philadelphia, PA (United States)
3. Brookhaven National Lab. (BNL), Upton, NY (United States)
4. Science and Technology Facilities Council (STFC), Oxford (United Kingdom). Rutherford Appleton Lab. (RAL); Harwell Science and Innovation Campus, Didcot (United Kingdom)

The ATLAS experiment is currently preparing for an upgrade of the inner tracking detector for the High-Luminosity LHC. The new tracker, ITk, employs an all-silicon detector with outer strip layers. The building block of the ITk strip barrel is the stave which consists of a low-mass support structure hosting the common electrical, optical and cooling services as well as 28 silicon modules. In this contribution, we outline the challenging aspects of the stave pre-production testing phase at Brookhaven National Laboratory. Here, the electrical characterization of these staves, hosting the final design of all ASICs, will be discussed in detail.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP)
• Grant/Contract Number: SC0012704
• OSTI ID: 1923324
• Report Number(s): BNL-223973-2023-JAAM
• Journal Information: Journal of Instrumentation, Journal Name: Journal of Instrumentation Journal Issue: 01 Vol. 18; ISSN 1748-0221
• Publisher: Institute of Physics (IOP)
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Electronic detector readout concepts (solid-state)
Front-end electronics for detector readout
Radiation-hard detectors
Si microchip and pad detectors