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Improved Heralded Single-Photon Source with a Photon-Number-Resolving Superconducting Nanowire Detector

Journal Article · · Phys.Rev.Applied
Deterministic generation of single photons is essential for many quantum information technologies. A bulk optical nonlinearity emitting a photon pair, where the measurement of one of the photons heralds the presence of the other, is commonly used with the caveat that the single-photon emission rate is constrained due to a trade-off between multiphoton events and pair emission rate. Using an efficient and low noise photon-number-resolving superconducting nanowire detector we herald, in real time, a single photon at telecommunication wavelength. We perform a second-order photon correlation g2(0) measurement of the signal mode conditioned on the measured photon number of the idler mode for various pump powers and demonstrate an improvement of a heralded single-photon source. We develop an analytical model using a phase-space formalism that encompasses all multiphoton effects and relevant imperfections, such as loss and multiple Schmidt modes. We perform a maximum-likelihood fit to test the agreement of the model to the data and extract the best-fit mean photon number μ of the pair source for each pump power. A maximum reduction of 0.118±0.012 in the photon g2(0) correlation function at μ=0.327±0.007 is obtained, indicating a strong suppression of multiphoton emissions. For a fixed g2(0)=7×103 , we increase the single pair generation probability by 25%. Our experiment, built using fiber-coupled and off-the-shelf components, delineates a path to engineering ideal sources of single photons.
Research Organization:
Caltech; MIT; Caltech, JPL; Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States); Caltech, Pasadena (main)
Sponsoring Organization:
US Department of Energy
DOE Contract Number:
AC02-07CH11359
OSTI ID:
1922105
Report Number(s):
FERMILAB-PUB-22-950-QIS; oai:inspirehep.net:1995330; arXiv:2112.11430
Journal Information:
Phys.Rev.Applied, Journal Name: Phys.Rev.Applied Journal Issue: 6 Vol. 18
Country of Publication:
United States
Language:
English

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