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Short-Range Mechanisms in the Creation of a ZnO/InGaAs Interface

Journal Article · · Crystal Growth and Design
 [1];  [2];  [3];  [4];  [5]
  1. Synchrotron SOLEIL, Gif-sur-Yvette (France)
  2. Univ. of Grenoble Alpes, Grenoble (France); Laboratoire des Technologies de la Microctronique (LTM), Grenoble (France)
  3. Univ. of Grenoble Alpes, Grenoble (France); European Synchrotron Radiation Facility (ESRF), Grenoble (France)
  4. Argonne National Lab. (ANL), Lemont, IL (United States)
  5. Univ. of Grenoble Alpes, Grenoble (France)
Here we perform quantitative analysis of the X-ray absorption data taken in situ during the earliest cycles of the ZnO atomic layer deposition on atomically flat InGaAs (001) surfaces. As deposition progresses, we observe a transition from an amorphous structure to a nanocrystalline one. The former retains much of the characteristics of a ZnO crystal in the Zn coordination shell, while the latter shows atomic ordering up to at least the third neighbor shell of Zn atoms, despite the absence of Bragg X-ray diffraction peaks. We show that the different chemical preparation of the substrate surface affects the ZnO local structure and that, counterintuitively, a stronger short-range order is obtained in the nanostructures characterized by lower local order at the interface. We propose a model that accounts for these findings.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
LabEx Minos; Nanosciences Foundation; USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1909337
Journal Information:
Crystal Growth and Design, Journal Name: Crystal Growth and Design Journal Issue: 8 Vol. 22; ISSN 1528-7483
Publisher:
American Chemical SocietyCopyright Statement
Country of Publication:
United States
Language:
English

References (41)

Recent Advances in Understanding the Structure and Properties of Amorphous Oxide Semiconductors journal August 2017
In Situ Ellipsometry Study of the Early Stage of ZnO Atomic Layer Deposition on In 0.53 Ga 0.47 As journal January 2020
Evaluation of Alternative Atomistic Models for the Incipient Growth of ZnO by Atomic Layer Deposition journal March 2017
Structure of amorphous silicon investigated by EXAFS journal January 2003
Remote phonon and surface roughness limited universal electron mobility of In0.53Ga0.47As surface channel MOSFETs journal July 2011
SIRIUS: A new beamline for in situ X-ray diffraction and spectroscopy studies of advanced materials and nanostructures at the SOLEIL Synchrotron journal October 2016
In situ ellipsometry monitoring of TiO2 atomic layer deposition from Tetrakis(dimethylamido)titanium(IV) and H2O precursors on Si and In0.53Ga0.47As substrates journal April 2021
An Atomistic View of the Incipient Growth of Zinc Oxide Nanolayers journal August 2016
Evolution of Crystal Structure During the Initial Stages of ZnO Atomic Layer Deposition journal January 2016
Insights into Crystalline Preorganization of Gas-Phase Precursors: Densification Mechanisms journal February 2008
A View from the Inside:  Complexity in the Atomic Scale Ordering of Supported Metal Nanoparticles journal December 2001
Nanometre-scale electronics with III–V compound semiconductors journal November 2011
The initial stages of ZnO atomic layer deposition on atomically flat In 0.53 Ga 0.47 As substrates journal January 2018
Nucleation and growth of atomic layer deposition of HfO2 gate dielectric layers on silicon oxide: a multiscale modelling investigation journal January 2009
Arsenic-dominated chemistry in the acid cleaning of InGaAs and InAlAs surfaces journal November 2008
InGaAs surface preparation for atomic layer deposition by hydrogen cleaning and improvement with high temperature anneal journal July 2011
Density functional theory simulations of amorphous high-κ oxides on a compound semiconductor alloy: a-Al2O3/InGaAs(100)-(4×2), a-HfO2/InGaAs(100)-(4×2), and a-ZrO2/InGaAs(100)-(4×2) journal December 2011
Extended x-ray absorption fine structure study of porous GaSb formed by ion implantation journal December 2011
Characterization of the local structure of amorphous GaAs produced by ion implantation journal May 1998
A unified model for insulator selection to form ultra-low resistivity metal-insulator-semiconductor contacts to n-Si, n-Ge, and n-InGaAs journal July 2012
Arsenic decapping and pre-atomic layer deposition trimethylaluminum passivation of Al 2 O 3 /InGaAs(100) interfaces journal August 2013
The comprehensive study and the reduction of contact resistivity on the n-InGaAs M-I-S contact system with different inserted insulators journal May 2015
Nanoscale physics and defect state chemistry at amorphous-Si/In0.53Ga0.47As interfaces journal December 2013
Atomic layer deposition of ZnO: a review journal February 2014
The Numerical Solution of Schrödinger's Equation journal June 1934
Real-space multiple-scattering calculation and interpretation of x-ray-absorption near-edge structure journal September 1998
Composition-dependent bond lengths in crystalline and amorphized Ge x Si 1 − x alloys journal October 1999
Elimination of self-absorption in fluorescence hard-x-ray absorption spectra journal October 1999
Ion-dose-dependent microstructure in amorphous Ge journal May 2000
Vibrational properties of Ge nanocrystals determined by EXAFS journal November 2006
Size-dependent characterization of embedded Ge nanocrystals: Structural and thermal properties journal September 2008
Anisotropic vibrations in crystalline and amorphous InP journal May 2009
Ion-irradiation-induced amorphization of cobalt nanoparticles journal April 2010
Formation and vanishing of short range ordering inGaAs1−xBixthin films journal November 2010
Making amorphous ZnO: Theoretical predictions of its structure and stability journal January 2019
In situ x-ray studies of the incipient ZnO atomic layer deposition on In 0.53 Ga 0.47 As journal April 2020
Extended x-ray absorption fine structure—its strengths and limitations as a structural tool journal October 1981
Treatment of EXAFS data taken in the fluorescence mode in non-linear conditions journal April 2004
ATHENA , ARTEMIS , HEPHAESTUS : data analysis for X-ray absorption spectroscopy using IFEFFIT journal June 2005
Band offsets, Schottky barrier heights, and their effects on electronic devices journal September 2013
Standing and sitting adlayers in atomic layer deposition of ZnO journal December 2015

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