Short-Range Mechanisms in the Creation of a ZnO/InGaAs Interface
Journal Article
·
· Crystal Growth and Design
- Synchrotron SOLEIL, Gif-sur-Yvette (France)
- Univ. of Grenoble Alpes, Grenoble (France); Laboratoire des Technologies de la Microctronique (LTM), Grenoble (France)
- Univ. of Grenoble Alpes, Grenoble (France); European Synchrotron Radiation Facility (ESRF), Grenoble (France)
- Argonne National Lab. (ANL), Lemont, IL (United States)
- Univ. of Grenoble Alpes, Grenoble (France)
Here we perform quantitative analysis of the X-ray absorption data taken in situ during the earliest cycles of the ZnO atomic layer deposition on atomically flat InGaAs (001) surfaces. As deposition progresses, we observe a transition from an amorphous structure to a nanocrystalline one. The former retains much of the characteristics of a ZnO crystal in the Zn coordination shell, while the latter shows atomic ordering up to at least the third neighbor shell of Zn atoms, despite the absence of Bragg X-ray diffraction peaks. We show that the different chemical preparation of the substrate surface affects the ZnO local structure and that, counterintuitively, a stronger short-range order is obtained in the nanostructures characterized by lower local order at the interface. We propose a model that accounts for these findings.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- LabEx Minos; Nanosciences Foundation; USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1909337
- Journal Information:
- Crystal Growth and Design, Journal Name: Crystal Growth and Design Journal Issue: 8 Vol. 22; ISSN 1528-7483
- Publisher:
- American Chemical SocietyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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