SIMS Investigation of Furnace-Baked Nb

Conference · Sun May 01 04:00:00 EDT 2022

DOI:https://doi.org/10.18429/JACoW-SRF2021-THPFDV003· OSTI ID:1905491

Lechner, E. M. ^[1]; Kelley, M. J. ^[2]; Palczewski, A. D. ^[1]; Reece, C. E. ^[1]; Angle, J. V. ^[3]; Stevie, F. A. ^[4]

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1. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
2. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States); Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
3. Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
4. North Carolina State Univ., Raleigh, NC (United States)

Results recently published by Ito et al. showed that "furnace baking" Nb SRF cavities after electropolishing yields high quality factors and anti-Q-slopes resembling that of N doped cavities. Small Nb samples were prepared following the recipe outlined by Ito. These samples were measured by SIMS to examine impurity contributions to the RF penetration layer. These diffusion profiles are modeled, and their consequences on RF properties discussed.

• Research Organization: Thomas Jefferson National Accelerator Facility, Newport News, VA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Nuclear Physics (NP)
• DOE Contract Number: AC05-06OR23177
• OSTI ID: 1905491
• Report Number(s): JLAB-ACC-21-3447; DOE/OR/23177-5263
• Country of Publication: United States
• Language: English