Early Stage Mechanisms in Time-Dependent Dielectric Breakdown in the Si/SiO2 System.

Conference · Tue Nov 30 23:00:00 EST 2021

DOI:https://doi.org/10.2172/1903089· OSTI ID:1903089

Sharov, Fedor V.; Moxim, Stephen J.; Hughart, David; Haase, Gad; Lenahan, Patrick M.

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: NA0003525
• OSTI ID: 1903089
• Report Number(s): SAND2021-15348C; 702216
• Country of Publication: United States
• Language: English