Investigating Volumetric Inclusions of Semiconductor Materials to Improve Flashover Resistance in Dielectrics.

Conference · 01 November 2021

DOI:https://doi.org/10.2172/1899533· OSTI ID:1899533

Steiner, Adam; Siefert, Christopher; Shipley, Gabriel; Redline, Erica; Dickens, Sara; Jaramillo, Rex; Chavez, Thomas P; Hutsel, Brian; Frye-Mason, Gregory; Peterson, Kyle; Bell, Kate; Balogun, Shuaib; Losego, Mark; Sammeth, Torin; Kern, Ian; Harjes, Cameron; Gilmore, Mark; Lehr, Jane

Abstract not provided.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: NA0003525
• OSTI ID: 1899533
• Report Number(s): SAND2021-14840C; 701903
• Resource Type: Conference poster
• Conference Information: Proposed for presentation at the 23rd IEEE Pulsed Power Conference held December 12-16, 2021 in Denver, CO.
• Country of Publication: United States
• Language: English