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Title: M-STAR: Magnetism second target advanced reflectometer at the Spallation Neutron Source

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/5.0093622· OSTI ID:1895241
ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [3]; ORCiD logo [4]; ORCiD logo [5]; ORCiD logo [6]; ORCiD logo [7]; ORCiD logo [6]; ORCiD logo [8]; ORCiD logo [7]; ORCiD logo [1]; ORCiD logo [8]; ORCiD logo [9]; ORCiD logo [10]; ORCiD logo [11]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Univ. of California, Los Angeles, CA (United States)
  3. Univ. of Alabama, Tuscaloosa, AL (United States)
  4. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
  5. Ruhr-Univ. Bochum (Germany); Inst. Laue Langevin, Grenoble (France)
  6. Univ. of Tennessee, Knoxville, TN (United States)
  7. Univ. of Notre Dame, IN (United States)
  8. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
  9. Purdue Univ., West Lafayette, IN (United States)
  10. Univ. of Missouri, Columbia, MO (United States)
  11. Northeastern Univ., Boston, MA (United States)

M-STAR is a next generation polarized neutron reflectometer with advanced capabilities. A new focusing guide concept is optimized for samples with dimensions down to a millimeter range. A proposed hybrid pulse-skipping chopper will enable experiments at constant geometry at one incident angle in a broad range of wavevector transfer Q up to 0.3 A–1 for specular, off-specular, and GISANS measurements. M-STAR will empower nanoscience and spintronics studies routinely on small samples (~2 × 2 mm2) and of atomic-scale thickness using versatile experimental conditions of magnetic and/or electric fields, light, and temperature applied in situ to novel complex device-like nanosystems with multiple buried interfaces. M-STAR will enable improved grazing incidence diffraction measurements, as a surface-sensitive depth-resolved probe of, e.g., the out-of-plane component of atomic magnetic moments in ferromagnetic, antiferromagnetic, and more complex structures as well as in-plane atomic-scale structures inaccessible with contemporary diffractometry and reflectometry. New horizons will be opened by the development of an option to probe near-surface dynamics with inelastic grazing incidence scattering in the time-of-flight mode. These novel options in combination with ideally matched parameters of the second target station will place M-STAR in the world’s leading position for high resolution polarized reflectometry.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1895241
Journal Information:
Review of Scientific Instruments, Vol. 93, Issue 10; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

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