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Characterization of the Thermal Properties of Ir/Pt Bilayer Transition Edge Sensors

Journal Article · · Journal of Low Temperature Physics
 [1];  [2];  [3];  [4];  [5];  [1];  [1];  [1];  [1];  [6];  [1];  [5];  [1];  [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States); Univ. of Chicago, IL (United States). Kavli Inst. for Cosmological Physics (KICP)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  4. Drexel Univ., Philadelphia, PA (United States)
  5. Univ. of California, Berkeley, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  6. Univ. of California, Berkeley, CA (United States)

In this work, we are developing a low-Tc TES-based large-area and low-threshold detector targeting a variety of potential applications. The detector consists of a 50.8-mm-diameter Si wafer as the substrate and radiation absorber, a single Ir/Pt bilayer TES sensor in the center, and normal metal Au pads added to the TES to strengthen the TES–absorber thermal coupling. Tight TES–absorber thermal coupling improves detector sensitivity and response uniformity. Here, we report on the electron–phonon (e–ph) coupling strengths for the Ir/Pt bilayer and Au that are measured with our prototype detectors and TES devices. We found that a second weak thermal link besides the one due to e–ph coupling in Ir/Pt or Au was required to explain our data. With the effects of the second weak link accounted for, the extracted e–ph coupling constant Σ for Ir/Pt bilayer in the Tc range between 32 and 70 mK is 1.9×108 WK-5m-3, and Σ’s for Au at 40 mK and 55 mK are 2.2×109 WK-5m-3 and 3.2×109 WK-5m-3, respectively.

Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Nuclear Physics (NP); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
Grant/Contract Number:
AC02-05CH11231; AC02-06CH11357; FG02-00ER41138
OSTI ID:
1891876
Alternate ID(s):
OSTI ID: 1969126
Journal Information:
Journal of Low Temperature Physics, Journal Name: Journal of Low Temperature Physics Journal Issue: 1-2 Vol. 210; ISSN 0022-2291
Publisher:
Springer NatureCopyright Statement
Country of Publication:
United States
Language:
English

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Temporal measurement of hot-electron relaxation in a phonon-cooled metal island journal April 2004
Observation of disorder-induced weakening of electron-phonon interaction in thin noble-metal films journal July 2005
Hot electrons and energy transport in metals at millikelvin temperatures journal July 1985

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