Data-driven surrogate modeling of hPIC ion energy-angle distributions for high-dimensional sensitivity analysis of plasma parameters' uncertainty
Journal Article
·
· Computer Physics Communications
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Univ. of Illinois at Urbana-Champaign, IL (United States)
In this work, we present a data-driven strategy for effective construction of a surrogate model in high-dimensional parameter space for the ion energy-angle distribution (IEAD) output of hPIC simulations of plasma-surface interactions. The methodology is based on a bin-by-bin least-squares fitting of the IEAD in the parameter space. The fitting is performed in a transformed coordinate system to normalize the IEAD, and it employs sparse grids for sampling the parameter space to overcome sampling challenges in high dimensions. The surrogate model is significantly cheaper computationally than direct hPIC simulations yet maintains high fidelity to them, providing a fast emulator for hPIC simulations. Sensitivity analysis based on the surrogate model is utilized to characterize the dependence of the ion impact angle and energy moments on the physical parameters.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR); USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR). Scientific Discovery through Advanced Computing (SciDAC); USDOE Office of Science (SC), Fusion Energy Sciences (FES)
- Grant/Contract Number:
- AC05-00OR22725; SC0018141
- OSTI ID:
- 1890337
- Alternate ID(s):
- OSTI ID: 1874063
- Journal Information:
- Computer Physics Communications, Journal Name: Computer Physics Communications Vol. 279; ISSN 0010-4655
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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