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U.S. Department of Energy
Office of Scientific and Technical Information

ML for Semiconductor Bond Pad Defect Detection.

Conference ·
DOI:https://doi.org/10.2172/1882316· OSTI ID:1882316
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
1882316
Report Number(s):
SAND2021-8212C; 698075
Country of Publication:
United States
Language:
English

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