Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Total-Ionizing-Dose Effects on Read Noise of MLC 3D NAND Memories.

Conference ·
DOI:https://doi.org/10.2172/1873467· OSTI ID:1873467
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Nuclear Energy (NE)
DOE Contract Number:
NA0003525
OSTI ID:
1873467
Report Number(s):
SAND2021-7161C; 696913
Country of Publication:
United States
Language:
English

Similar Records

Total-Ionizing-Dose Effects on Long-term Data Retention Characteristics of Commercial 3D NAND Memories.
Conference · Tue Jun 01 00:00:00 EDT 2021 · OSTI ID:1873468

Total-Ionizing-Dose Effects on Read Noise of MLC 3-D NAND Memories T
Journal Article · Mon Jan 03 19:00:00 EST 2022 · IEEE Transactions on Nuclear Science · OSTI ID:1841982

Total Ionizing Dose Effects in NOR and NAND Flash Memories.
Conference · Thu Jun 01 00:00:00 EDT 2006 · OSTI ID:1266160

Related Subjects