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Effects of Surface Roughness and Aging on the Electrical Contact Resistance and Residual Stress in Gold-Nickel-Copper Connector Materials.

Thesis/Dissertation ·
OSTI ID:1873216
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
1873216
Report Number(s):
SAND2022-8284T; 707455
Country of Publication:
United States
Language:
English

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