Characterization of 128 × 128 MM-PAD-2.1 ASIC: a fast framing hard x-ray detector with high dynamic range

Journal Article · Mon Mar 07 00:00:00 EST 2022 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/17/03/p03003· OSTI ID:1870411

Gadkari, D. ^[1]; Shanks, K. S. ^[1]; Hu, H. ^[2]; Philipp, H. T. ^[1]; Tate, M. W. ^[1]; Thom-Levy, J. ^[1]; Gruner, S. M. ^[1]

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1. Cornell Univ., Ithaca, NY (United States)
2. Cornell Univ., Ithaca, NY (United States); Univ. of Chicago, IL (United States)

Here, we characterize a new x-ray Mixed-Mode Pixel Array Detector (MM-PAD-2.1) Application Specific Integrated Circuit (ASIC). Using an integrating pixel front-end with dynamic charge removal architecture, the MM-PAD-2.1 ASIC extends the maximum measurable x-ray signal (in 20 keV photon units) to > 10⁷ x-rays/pixel/frame while maintaining a low read noise across the full dynamic range, all while imaging continuously at a frame rate of up to 10 kHz. The in-pixel dynamic charge removal mechanism prevents saturation of the input amplifier and proceeds in parallel with signal integration to achieve deadtime-less measurements with incident x-ray rates of > 10¹⁰ x-rays/pixel/s. The ASIC format consists of 128 × 128 square pixels each 150 μm on a side and is designed to be 3-side buttable so large arrays can be effectively tiled. Here we use both laboratory x-ray sources and the Cornell High Energy Synchrotron Source (CHESS) to characterize two single ASIC prototype detectors for both low (single x-ray) and high incident flux detection. In the first detector the ASIC was solder bump-bonded to a 500 μm thick Si sensor for efficient detection of x-rays below 20 keV, whereas the second detector used a 750 μm thick CdTe sensor for x-rays above ~20 keV.

• Research Organization: Cornell Univ., Ithaca, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
• Grant/Contract Number: SC0017631; FG02-10ER46693; SC0016035; SC0004079; DMR-1829070
• OSTI ID: 1870411
• Journal Information: Journal of Instrumentation, Vol. 17, Issue 03; ISSN 1748-0221
• Publisher: Institute of Physics (IOP)
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
36 MATERIALS SCIENCE
Electronic detector readout concepts (solid-state)
Front-end electronics for detector readout
Hybrid detectors
X-ray detectors