Quasi‐2D Perovskite Crystalline Layers for Printable Direct Conversion X‐Ray Imaging

Tsai, Hsinhan; Shrestha, Shreetu; Pan, Lei; Huang, Hsin‐Hsiang; Strzalka, Joseph; Williams, Darrick; Wang, Leeyih; Cao, Lei. R.; Nie, Wanyi

doi:10.1002/adma.202106498

Quasi‐2D Perovskite Crystalline Layers for Printable Direct Conversion X‐Ray Imaging

Journal Article · Sat Feb 19 00:00:00 EST 2022 · Advanced Materials

DOI:https://doi.org/10.1002/adma.202106498· OSTI ID:1845921

Tsai, Hsinhan ^[1]; Shrestha, Shreetu ^[2]; Pan, Lei ^[3]; Huang, Hsin‐Hsiang ^[4]; Strzalka, Joseph ^[5]; Williams, Darrick ^[2]; Wang, Leeyih ^[6]; Cao, Lei. R. ^[3]; ^[2]

Center for Integrated Nanotechnologies Los Alamos National Laboratory Los Alamos NM 87544 USA, Department of Chemistry University of California, Berkeley Berkeley CA 94720 USA
Center for Integrated Nanotechnologies Los Alamos National Laboratory Los Alamos NM 87544 USA
Nuclear Engineering Program Department of Mechanical and Aerospace Engineering The Ohio State University Columbus OH 43210 USA
Center for Condensed Matter Sciences National Taiwan University No. 1, Sec. 4, Roosevelt Rd. Taipei 10617 Taiwan, Department of Material Science and Engineering National Taiwan University No. 1, Sec. 4, Roosevelt Rd. Taipei 10617 Taiwan
X‐Ray Science Division Argonne National Laboratory Lemont IL 60439 USA
Center for Condensed Matter Sciences National Taiwan University No. 1, Sec. 4, Roosevelt Rd. Taipei 10617 Taiwan

Abstract

Polycrystalline perovskite film‐based X‐ray detector is an appealing technology for assembling large scale imager by printing methods. However, thick crystalline layer without trap and solvent residual is challenging to fabricate. Here, the authors report a solution method to produce high quality quasi‐2D perovskite crystalline layers and detectors that are suitable for X‐ray imaging. By introducing n ‐butylamine iodide into methylammonium lead iodide precursor and coating at elevated temperatures, compact and crystalline layers with exceptional uniformity are obtained on both rigid and flexible substrates. Photodiodes built with the quasi‐2D layers exhibit a low dark current and stable operation under constant electrical field over 96 h in dark, and over 15 h under X‐ray irradiation. The detector responds sensitively under X‐ray, delivering a high sensitivity of 1214 µC Gy _air ⁻¹ cm ⁻² and a sensitivity gain is observed when operated under higher fields. Finally, high resolution images are demonstrated using a single pixel device that can resolve 80–200 µm features. This work paves the path for printable direct conversion X‐ray imager development.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Organization:: Defense Threat Reduction Agency (DTRA); J. Robert Oppenheimer (JRO) Distinguished Postdoc Fellowship; Ministry of Science and Technology Taiwan; National Taiwan University; USDOE; USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC)

Grant/Contract Number:: 89233218CNA000001; AC02-06CH11357

OSTI ID:: 1845921

Alternate ID(s):: OSTI ID: 1845923
OSTI ID: 1846916
OSTI ID: 1869205

Report Number(s):: LA-UR-21-29520; 2106498

Journal Information:: Advanced Materials, Journal Name: Advanced Materials Journal Issue: 13 Vol. 34; ISSN 0935-9648

Publisher:: Wiley Blackwell (John Wiley & Sons)Copyright Statement

Country of Publication:: Germany

Language:: English

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36 MATERIALS SCIENCE
polycrystalline-based detectors
quasi-2D perovskites
x-ray detectors

Quasi‐2D Perovskite Crystalline Layers for Printable Direct Conversion X‐Ray Imaging

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