This paper reports the results of an international interlaboratory comparison study on light‐ and elevated temperature‐induced degradation (LETID) on crystalline silicon photovoltaic (PV) modules. A large global network of PV module manufacturers and PV testing laboratories collaborated to design a protocol for LETID detection and screen a large and diverse set of prototype modules for LETID. Results across labs indicate the reproducibility of LETID testing is likely within ±1% of maximum power (P MP ). In intentionally engineered LETID‐sensitive modules, mean degradation after the prescribed detection stress is roughly 6% P MP . In other module types the LETID sensitivity is smaller, and in some we observe essentially negligible degradation attributable to LETID. In LETID‐sensitive modules, both open‐circuit voltage (V OC ) and short‐circuit current (I SC ) degrade by a roughly similar magnitude. We observe, as do previous studies, that LETID affects each cell in a module differently. An investigation of the potential mismatch losses caused by nonuniform LETID degradation found that mismatch loss is insignificant compared to the estimated loss of cell I SC , which drives loss of module I SC . Overall, this work has helped inform the creation of a forthcoming standard technical specification for LETID testing of PV modules, IEC TS 63342 ED1, and should aid in the interpretation of results from that and other LETID tests.
Karas, Joseph, et al. "Results from an international interlaboratory study on light‐ and elevated temperature‐induced degradation in solar modules." Progress in Photovoltaics, vol. 30, no. 11, May. 2022. https://doi.org/10.1002/pip.3573
Karas, Joseph, Repins, Ingrid, Berger, Karl A., Kubicek, Bernhard, Jiang, Fangdan, Zhang, Daqi, Jaubert, Jean‐Nicolas, Cueli, Ana Belén, Sample, Tony, Jaeckel, Bengt, Pander, Matthias, Fokuhl, Esther, Koentopp, Max B., Kersten, Friederike, Choi, Jun‐Hong, Bora, Birinchi, Banerjee, Chandan, Wendlandt, Stefan, ... Maaroufi, Hamza (2022). Results from an international interlaboratory study on light‐ and elevated temperature‐induced degradation in solar modules. Progress in Photovoltaics, 30(11). https://doi.org/10.1002/pip.3573
Karas, Joseph, Repins, Ingrid, Berger, Karl A., et al., "Results from an international interlaboratory study on light‐ and elevated temperature‐induced degradation in solar modules," Progress in Photovoltaics 30, no. 11 (2022), https://doi.org/10.1002/pip.3573
@article{osti_1866505,
author = {Karas, Joseph and Repins, Ingrid and Berger, Karl A. and Kubicek, Bernhard and Jiang, Fangdan and Zhang, Daqi and Jaubert, Jean‐Nicolas and Cueli, Ana Belén and Sample, Tony and Jaeckel, Bengt and others},
title = {Results from an international interlaboratory study on light‐ and elevated temperature‐induced degradation in solar modules},
annote = {Abstract This paper reports the results of an international interlaboratory comparison study on light‐ and elevated temperature‐induced degradation (LETID) on crystalline silicon photovoltaic (PV) modules. A large global network of PV module manufacturers and PV testing laboratories collaborated to design a protocol for LETID detection and screen a large and diverse set of prototype modules for LETID. Results across labs indicate the reproducibility of LETID testing is likely within ±1% of maximum power (P MP ). In intentionally engineered LETID‐sensitive modules, mean degradation after the prescribed detection stress is roughly 6% P MP . In other module types the LETID sensitivity is smaller, and in some we observe essentially negligible degradation attributable to LETID. In LETID‐sensitive modules, both open‐circuit voltage (V OC ) and short‐circuit current (I SC ) degrade by a roughly similar magnitude. We observe, as do previous studies, that LETID affects each cell in a module differently. An investigation of the potential mismatch losses caused by nonuniform LETID degradation found that mismatch loss is insignificant compared to the estimated loss of cell I SC , which drives loss of module I SC . Overall, this work has helped inform the creation of a forthcoming standard technical specification for LETID testing of PV modules, IEC TS 63342 ED1, and should aid in the interpretation of results from that and other LETID tests. },
doi = {10.1002/pip.3573},
url = {https://www.osti.gov/biblio/1866505},
journal = {Progress in Photovoltaics},
issn = {ISSN 1062-7995},
number = {11},
volume = {30},
place = {United Kingdom},
publisher = {Wiley Blackwell (John Wiley & Sons)},
year = {2022},
month = {05}}
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
German Federal Ministry for Economic Affairs and Energy (BMWi); USDOE; USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
1866505
Alternate ID(s):
OSTI ID: 1866509 OSTI ID: 1867875
Report Number(s):
NREL/JA-5K00-81318
Journal Information:
Progress in Photovoltaics, Journal Name: Progress in Photovoltaics Journal Issue: 11 Vol. 30; ISSN 1062-7995
Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference 2002, Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.https://doi.org/10.1109/PVSC.2002.1190548
Wenham, Alison Ciesla nee; Wenham, Stuart; Chen, Ran
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