Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps
- EXpressLO LLC, Lehigh Acres, FL (United States)
- Alcorix Company, Plainfield, IL (United States)
- Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Low-Z nanocrystalline diamond (NCD) grids have been developed to reduce spurious fluorescence and avoid X-ray peak overlaps or interferences between the specimen and conventional metal grids. Here, the low-Z NCD grids are non-toxic and safe to handle, conductive, can be subjected to high-temperature heating experiments, and may be used for analytical work in lieu of metal grids. Both a half-grid geometry, which can be used for any lift-out method, or a full-grid geometry that can be used for ex situ lift-out or thin film analyses, can be fabricated and used for experiments.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- NA0003525
- OSTI ID:
- 1855806
- Report Number(s):
- SAND2022-2600J; 703917
- Journal Information:
- Microscopy Today, Journal Name: Microscopy Today Journal Issue: 2 Vol. 30; ISSN 1551-9295
- Publisher:
- Cambridge University PressCopyright Statement
- Country of Publication:
- United States
- Language:
- English
| Transmission Electron Microscopy | book | January 2009 |
Introduction to Focused Ion Beams
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book | January 2005 |
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