Room temperature depinning of the charge-density waves in quasi-two-dimensional 1T-TaS2 devices
- Univ. of California, Riverside, CA (United States); Univ. of California, Riverside (United States)
- Polish Academy of Sciences (PAS), Warsaw (Poland)
- Univ. of California, Riverside, CA (United States)
- Gdansk University of Technology (Poland)
- Polish Academy of Sciences (PAS), Warsaw (Poland); Warsaw Univ. of Technology (Poland); University of Montpellier (France); Centre National de la Recherche Scientifique (CNRS) (France)
Here we report on the depinning of nearly commensurate charge-density waves in 1T-TaS2 thin films at room temperature. A combination of the differential current–voltage measurements with the low-frequency noise spectroscopy provides unambiguous means for detecting the depinning threshold field in quasi-2D materials. The depinning process in 1T-TaS2 is not accompanied by an observable abrupt increase in electric current—in striking contrast to depinning in the conventional charge-density-wave materials with quasi-1D crystal structure. We explained it by the fact that the current density from the charge-density waves in the 1T-TaS2 devices is orders of magnitude smaller than the current density of the free carriers available in the discommensuration network surrounding the commensurate charge-density wave islands. The depinning fields in 1T-TaS2 thin-film devices are several orders of magnitude larger than those in quasi-1D van der Waals materials. Obtained results are important for the proposed applications of the charge-density wave devices in electronics.
- Research Organization:
- Univ. of California, Riverside, CA (United States)
- Sponsoring Organization:
- European Union (EU); Foundation for Polish Sciences; USDOE; USDOE Office of Science (SC); USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0021020
- OSTI ID:
- 1853705
- Alternate ID(s):
- OSTI ID: 1785398
OSTI ID: 1904171
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 22 Vol. 118; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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