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Stress effects on the energy barrier and mechanisms of cross-slip in FCC nickel

Journal Article · · Journal of the Mechanics and Physics of Solids
 [1];  [2];  [2]
  1. Stanford Univ., CA (United States). Dept. of Mechanical Engineering; OSTI
  2. Stanford Univ., CA (United States). Dept. of Mechanical Engineering
The energy barrier for homogeneous cross-slip of a screw dislocation in face-centered cubic (FCC) nickel is calculated using atomistic simulations as a function of the Escaig stress on the glide plane, the Escaig stress on the cross-slip plane, and the Schmid stress on the cross-slip plane. Two cross-slip mechanisms, Friedel-Escaig (FE) and Fleischer, are examined and their energy barriers are calculated for a large number of stress combinations. For each mechanism, the energy barrier as a function of three stress components can be reduced into a one-dimensional function of an effective stress. The stress domains in which FE and Fleischer mechanisms operate respectively are determined. Additionally, the FE mechanism dominates when the Escaig stress on the glide plane (in the direction that reduces the stacking fault width) is the largest stress component. Increasing the Schmid stress and Escaig stress (in the direction that expands the stacking fault width) on the cross slip plane promotes the Fleischer mechanism. The cross slip energy barrier functions obtained here can be used as input functions for computing cross slip rates in mesoscale dislocation dynamics simulations.
Research Organization:
Stanford Univ., CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
Grant/Contract Number:
SC0010412
OSTI ID:
1851374
Alternate ID(s):
OSTI ID: 1810947
Journal Information:
Journal of the Mechanics and Physics of Solids, Journal Name: Journal of the Mechanics and Physics of Solids Journal Issue: C Vol. 144; ISSN 0022-5096
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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