Characterization of high-purity germanium (Ge) crystals for developing novel Ge detectors

Raut, M. -S.; Mei, H.; Mei, D. -M.; Bhattarai, S.; Wei, W. -Z.; Panth, R.; Acharya, P.; Wang, G. -J.

doi:10.1088/1748-0221/15/10/t10010

Characterization of high-purity germanium (Ge) crystals for developing novel Ge detectors

Journal Article · Thu Oct 01 04:00:00 EDT 2020 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/15/10/t10010· OSTI ID:1850847

Raut, M. -S. ^[1]; Mei, H.; Mei, D. -M.; Bhattarai, S.; Wei, W. -Z.; Panth, R.; Acharya, P.; Wang, G. -J.

OSTI

Not provided.

Research Organization:: Univ. of South Dakota, Vermillion, SD (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

DOE Contract Number:: SC0004768

OSTI ID:: 1850847

Journal Information:: Journal of Instrumentation, Journal Name: Journal of Instrumentation Journal Issue: 10 Vol. 15; ISSN 1748-0221

Publisher:: Institute of Physics (IOP)

Country of Publication:: United States

Language:: English

References (19)

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