Test Points for Online Monitoring of Quantum Circuits

Acharya, Nikita; Urbanek, Miroslav; De Jong, Wibe A.; Saeed, Samah Mohamed

doi:10.1145/3477928

Test Points for Online Monitoring of Quantum Circuits

Journal Article · Fri Oct 22 00:00:00 EDT 2021 · ACM Journal on Emerging Technologies in Computing Systems

DOI:https://doi.org/10.1145/3477928· OSTI ID:1846954

^[1]; Urbanek, Miroslav ^[2]; De Jong, Wibe A. ^[2]; ^[1]

City College of New York, NY (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Noisy Intermediate-Scale Quantum (NISQ) computers consisting of tens of inherently noisy quantum bits (qubits) suffer from reliability problems. Qubits and their gates are susceptible to various types of errors. Due to limited numbers of qubits and high error rates, quantum error correction cannot be applied. Physical constraints of quantum hardware including the error rates are used to guide the design and the layout of quantum circuits. The error rates determine the selection of qubits and their operations. The resulting circuit is executed on the quantum computer. This study explores the risk of unexpected changes in the error rates of NISQ computers post-calibration. We show that unexpected changes in error rates can alter the output state of a quantum circuit. To detect these changes, we propose the insertion of test points into the quantum circuit to enable online monitoring of the physical qubit behavior. We utilize classical, superposition, and uncompute test points. Furthermore, we use a gate error coverage metric to assess the quality of the tests. We verify the effectiveness of the proposed scheme on different IBM quantum computers (IBM Q), in addition to a noisy simulation that shows the scalability of the proposed approach.

Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC02-05CH11231; AC05-00OR22725

OSTI ID:: 1846954

Journal Information:: ACM Journal on Emerging Technologies in Computing Systems, Journal Name: ACM Journal on Emerging Technologies in Computing Systems Journal Issue: 1 Vol. 18; ISSN 1550-4832

Publisher:: Association for Computing Machinery (ACM)Copyright Statement

Country of Publication:: United States

Language:: English

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Related Subjects

97 MATHEMATICS AND COMPUTING
NISQ
computer systems organization
mapping
noisy intermediate-scale quantum computer
quantum circuit
quantum circuit test point
quantum computing
reliability
security
side-channel information

Test Points for Online Monitoring of Quantum Circuits

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References (11)

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