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Phonon modes and Raman signatures of MnBi2nTe3n+1(n=1,2,3,4) magnetic topological heterostructures

Journal Article · · Physical Review Research
 [1];  [1];  [2];  [1];  [2];  [3];  [3];  [1];  [3];  [2];  [1];  [1]
  1. Univ. of California, Los Angeles, CA (United States)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
  3. Univ. of California, Riverside, CA (United States)
+ Show Author Affiliations
An intrinsic antiferromagnetic topological insulator MnBi2Te4 arises when intercalating a Mn-Te bilayer chain in a topological insulator, Bi2Te3. We present observations on the inter- and intralayer phonon modes of the generalized MnBi2nTe3n+1(n=1,2,3,4) family using cryogenic low-frequency Raman spectroscopy with various polarization configurations. Two peaks at 66 and 112 cm–1 show abnormal perturbation in Raman linewidths below magnetic transition temperature due to spin-phonon coupling. In MnBi4Te7, Bi2Te3 layers induce Davydov splitting of the A1g mode around 137 cm–1 at 5 K. The out-of-plane interlayer force constant estimated using the linear chain model was (3.98±0.14)×1019N/m3, three times weaker than that of Bi2Te3. Adding more Bi2Te3 layers, such as MnBi6Te10 and MnBi8Te13, makes Bi2Te3 properties more dominant than magnetic properties. Our work experimentally and theoretically discovers the dynamics of phonon modes of MnBi2nTe3n+1 family, facilitating utilization of magnetic topological heterostructures.
Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); University of California, Los Angeles, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC05-00OR22725; SC0021020; SC0021117
OSTI ID:
1844797
Alternate ID(s):
OSTI ID: 1847548
OSTI ID: 2928530
Journal Information:
Physical Review Research, Journal Name: Physical Review Research Journal Issue: 1 Vol. 4; ISSN 2643-1564
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English

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