Analysis of the dependence of critical electric field on semiconductor bandgap

Slobodyan, Oleksiy; Flicker, Jack; Dickerson, Jeramy; Shoemaker, Jonah; Binder, Andrew; Smith, Trevor; Goodnick, Stephen; Kaplar, Robert; Hollis, Mark

doi:10.1557/s43578-021-00465-2

Analysis of the dependence of critical electric field on semiconductor bandgap

Journal Article · Mon Jan 31 23:00:00 EST 2022 · Journal of Materials Research

DOI:https://doi.org/10.1557/s43578-021-00465-2· OSTI ID:1843053

; Flicker, Jack; Dickerson, Jeramy; Shoemaker, Jonah; Binder, Andrew; Smith, Trevor; Goodnick, Stephen; Kaplar, Robert; Hollis, Mark

Abstract

Understanding of semiconductor breakdown under high electric fields is an important aspect of materials’ properties, particularly for the design of power devices. For decades, a power-law has been used to describe the dependence of material-specific critical electrical field ( $$$${\mathcal{E}}_{\text{crit}}$$$$ $E_{crit}$ ) at which the material breaks down and bandgap ( E _g ) . The relationship is often used to gauge tradeoffs of emerging materials whose properties haven’t yet been determined. Unfortunately, the reported dependencies of $$$${\mathcal{E}}_{\text{crit}}$$$$ $E_{crit}$ on E _g cover a surprisingly wide range in the literature. Moreover, $$$${\mathcal{E}}_{\text{crit}}$$$$ $E_{crit}$ is a function of material doping. Further, discrepancies arise in $$$${\mathcal{E}}_{\text{crit}}$$$$ $E_{crit}$ values owing to differences between punch-through and non-punch-through device structures. We report a new normalization procedure that enables comparison of critical electric field values across materials, doping, and different device types. An extensive examination of numerous references reveals that the dependence $$$${\mathcal{E}}_{\text{crit}}$$$$ $E_{crit}$ ∝ E _g ^1.83 best fits the most reliable and newest data for both direct and indirect semiconductors.

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Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: NA0003525; SC0021230

OSTI ID:: 1843053

Alternate ID(s):: OSTI ID: 1882882

Journal Information:: Journal of Materials Research, Journal Name: Journal of Materials Research Journal Issue: 4 Vol. 37; ISSN 0884-2914

Publisher:: Cambridge University Press (CUP)Copyright Statement

Country of Publication:: United States

Language:: English

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