Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- North Carolina State Univ., Raleigh, NC (United States)
- Carnegie Mellon Univ., Pittsburgh, PA (United States)
The effect of gnomonic distortion on orientation indexing of electron backscatter diffraction patterns is explored through simulation of electron diffraction patterns for sample-to-detector geometries associated with transmission Kikuchi diffraction (TKD) and electron backscatter diffraction (EBSD). Simulated data were analysed by computing a similarity index for both Hough transformed data and simulated patterns to determine the sensitivity of each method for detecting subtle differences in the effect of gnomonic distortions on electron diffraction patterns. These results indicate that the increased gnomonic distortions in electron diffraction patterns for a TKD geometry enhance the sensitivity for detecting subtle differences in interband angles. Additionally, the utilisation of a Hough transform-based indexing approach further enhances the sensitivity.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1838997
- Journal Information:
- Journal of Microscopy, Journal Name: Journal of Microscopy Journal Issue: 2 Vol. 285; ISSN 0022-2720
- Publisher:
- WileyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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