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Title: Dual-Wavelength Time-Resolved Photoluminescence Study of CdSexTe1-x Surface Passivation via MgyZn1-yO and Al2O3

Journal Article · · IEEE Journal of Photovoltaics
ORCiD logo [1];  [2];  [3]; ORCiD logo [3]; ORCiD logo [4]; ORCiD logo [3]
  1. National Renewable Energy Lab. (NREL), Golden, CO (United States); Colorado School of Mines, Golden, CO (United States)
  2. National Renewable Energy Lab. (NREL), Golden, CO (United States); Univ. of Illinois, Chicago, IL (United States)
  3. National Renewable Energy Lab. (NREL), Golden, CO (United States)
  4. Colorado School of Mines, Golden, CO (United States)

Voltage loss is currently one of the biggest challenges facing cadmium telluride (CdTe) based photovoltaics. Determining the location(s) of major voltage loss within the device stack (e.g., front/back interface, grain boundaries) is therefore of primary interest. Here, we present a custom-built time-resolved photoluminescence system with two excitation wavelengths - 670 (standard) and 405 nm - to probe the device stack at depths of approximately 130 and 35 nm, respectively; their comparison helps differentiate interface and bulk contributions to carrier lifetime. We apply this system to examine the passivation effect of two significant recent advances in CdTe: the incorporation of Se to form graded CdSe x Te 1-x and the replacement of CdS with Mg y Zn 1-y O. It is found that x = 0.2 Se is required to obtain lifetime improvements, primarily in the bulk. Additionally, evidence for trapping at the Mg y Zn 1-y O/CdSe x Te 1-x interface was observed. Furthermore, this indicates further work is required to sufficiently passivate the front interface.

Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
1836029
Report Number(s):
NREL/JA-5K00-80301; MainId:42504; UUID:1beed579-c572-407d-b10a-b1500ec26d8b; MainAdminID:63250
Journal Information:
IEEE Journal of Photovoltaics, Vol. 12, Issue 1; ISSN 2156-3381
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English

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