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Using Mask R-CNN to detect and mask ghosting and scattered-light artifacts in astronomical images

Conference ·
OSTI ID:1835872
Wide-field astronomical surveys are often affected by the presence of undesirable reflections (often known as “ghosting artifacts” or “ghosts”) and scattered-light artifacts. The identification and mitigation of these artifacts is important for rigorous astronomical analyses of faint and low-surface-brightness systems. In this work, we use images from the Dark Energy Survey (DES) to train, validate, and test a deep neural network (Mask R-CNN) to detect and localize ghosts and scattered- light artifacts. We find that the ability of the Mask R-CNN model to identify affected regions is superior to that of conventional algorithms that model the physical processes that lead to such artifacts, thus providing a powerful technique for the automated detection of ghosting and scattered-light artifacts in current and near-future surveys.
Research Organization:
Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
DOE Contract Number:
AC02-07CH11359
OSTI ID:
1835872
Report Number(s):
FERMILAB-CONF-21-535-SCD; oai:inspirehep.net:1989857
Country of Publication:
United States
Language:
English

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