Time-resolved RIXS experiment with pulse-by-pulse parallel readout data collection using X-ray free electron laser
Abstract Time-resolved resonant inelastic X-ray scattering (RIXS) is one of the developing techniques enabled by the advent of X-ray free electron laser (FEL). It is important to evaluate how the FEL jitter, which is inherent in the self-amplified spontaneous emission process, influences the RIXS measurement. Here, we use a microchannel plate (MCP) based Timepix soft X-ray detector to conduct a time-resolved RIXS measurement at the Ti L 3 -edge on a charge-density-wave material TiSe 2 . The fast parallel Timepix readout and single photon sensitivity enable pulse-by-pulse data acquisition and analysis. Due to the FEL jitter, low detection efficiency of spectrometer, and low quantum yield of RIXS process, we find that less than 2% of the X-ray FEL pulses produce signals, preventing acquiring sufficient data statistics while maintaining temporal and energy resolution in this measurement. These limitations can be mitigated by using future X-ray FELs with high repetition rates, approaching MHz such as the European XFEL in Germany and LCLS-II in the USA, as well as by utilizing advanced detectors, such as the prototype used in this study.
- Research Organization:
- SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS); Stanford Univ., CA (United States)
- Sponsoring Organization:
- USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
- Grant/Contract Number:
- AC02-76SF00515; AC02-05CH11231
- OSTI ID:
- 1833774
- Alternate ID(s):
- OSTI ID: 1755488
- Journal Information:
- Scientific Reports, Journal Name: Scientific Reports Vol. 10 Journal Issue: 1; ISSN 2045-2322
- Publisher:
- Nature Publishing GroupCopyright Statement
- Country of Publication:
- United Kingdom
- Language:
- English
Similar Records
Time-resolved ionization measurements with intense ultrashort XUV and X-ray free-electron laser pulses
Pulse-resolved intensity measurements at a hard X-ray FEL using semi-transparent diamond detectors