Extreme high-field superconductivity in thin Re films

Womack, F. N.; Young, D. P.; Browne, D. A.; Catelani, G.; Jiang, J.; Meletis, E. I.; Adams, P. W.

doi:10.1103/physrevb.103.024504

Extreme high-field superconductivity in thin Re films

Journal Article · Fri Jan 08 00:00:00 EST 2021 · Physical Review B

DOI:https://doi.org/10.1103/physrevb.103.024504· OSTI ID:1833368

Womack, F. N. ^[1]; Young, D. P. ^[2]; Browne, D. A. ^[2]; ^[3]; Jiang, J. ^[4]; Meletis, E. I. ^[4]; ^[2]

Louisiana State Univ., Baton Rouge, LA (United States); LSU (Baton Rouge)
Louisiana State Univ., Baton Rouge, LA (United States)
Forschungszentrum Jülich (Germany)
Univ. of Texas, Arlington, TX (United States)

We report the high-field superconducting properties of thin, disordered Re films via magnetotransport and tunneling density of states measurements. Films with thicknesses in the range of 9 to 3 nm had normal-state sheet resistances of ~0.2 kΩ to ~1 kΩ and corresponding transition temperatures in the range of 6 to 3 K. Tunneling spectra were consistent with those of a moderate coupling BCS superconductor. Notwithstanding these unremarkable superconducting properties, the films exhibited an extraordinarily high upper critical field. Here, we estimate their zero temperature H_c2 to be more than twice the Pauli limit. Indeed, in 6-nm samples the estimated reduced critical field H_c2/T_c ~ 5.6T/K is among the highest reported for any elemental superconductor. Although the sheet resistances of the films were well below the quantum resistance R_Q = h/4e², their H_c2's approached the theoretical upper limit of a strongly disordered superconductor for which k_Fℓ ~ 1.

View Accepted Manuscript (DOE)

Research Organization:: Louisiana State Univ., Baton Rouge, LA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: FG02-07ER46420

OSTI ID:: 1833368

Journal Information:: Physical Review B, Journal Name: Physical Review B Journal Issue: 2 Vol. 103; ISSN 2469-9950

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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