Investigating the Dielectric Properties of BTO Nanocomposites Using Novel Fabrication Techniques.
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- AFRL
- DOE Contract Number:
- NA0003525
- OSTI ID:
- 1831754
- Report Number(s):
- SAND2020-12722C; 692348
- Country of Publication:
- United States
- Language:
- English
Similar Records
Investigating the Dielectric Properties of BTO Nanocomposites Using Novel Fabrication Techniques.
Interface Trap State Analysis of Gate Dielectrics on Gallium Nitride and Silicon Carbide using a Novel Quasi-Static CV Technique.
Interface Trap State Analysis of Gate Dielectrics on Gallium Nitride and Silicon Carbide using a Novel Quasi-Static CV Technique.
Conference
·
Fri Jan 31 23:00:00 EST 2020
·
OSTI ID:1783596
Interface Trap State Analysis of Gate Dielectrics on Gallium Nitride and Silicon Carbide using a Novel Quasi-Static CV Technique.
Conference
·
Sat Oct 01 00:00:00 EDT 2022
·
OSTI ID:2005926
Interface Trap State Analysis of Gate Dielectrics on Gallium Nitride and Silicon Carbide using a Novel Quasi-Static CV Technique.
Conference
·
Tue Nov 01 00:00:00 EDT 2022
·
OSTI ID:2006045