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Title: X-ray topographic study of growth defects of trans-stilbene crystals grown from solutions

Journal Article · · Journal of Crystal Growth
 [1];  [2];  [2]
  1. RWTH Aachen Univ. (Germany). Institut für Kristallographie
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Single crystals of trans-stilbene, C14H12, with properties suitable for high-energy neutron detection were grown from solution in anisole and toluene by the temperature reduction method with growth rates up to 6 mm/day. From these crystals, slices of appropriate orientation and thickness of 2–4 mm were cut and studied by X-ray diffraction topography applying the Lang method using CuKα radiation. The topographs exhibit growth defects such as liquid inclusions, dislocations, striations, and faulty growth-sector boundaries. These defects occur in the same typical arrangements and geometries as is observed in all kinds of crystals grown on habit faces from solution. Besides growth dislocations originating from inclusions and propagating with the growth front, many plastic glide dislocations in the shape of loops or half-loops emitted from inclusions by stress relaxation are observed. Finally, the glide system underlying this plasticity is discussed.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC52-07NA27344; AC507NA27344
OSTI ID:
1829589
Alternate ID(s):
OSTI ID: 1248424
Report Number(s):
LLNL-JRNL-669662; 791457
Journal Information:
Journal of Crystal Growth, Vol. 429; ISSN 0022-0248
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 12 works
Citation information provided by
Web of Science

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Crystal growth, vibrational, Hirshfeld surface, thermal, optical, and etching analyses of lithium hydrogen phthalate dihydrate journal January 2020

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