Properties of intense ion beams from pinch-beam diodes
- Naval Research Lab., Washington, DC (United States). Plasma Physics Div.
Properties of pulsed ion beams from a pinch-beam diode on the Gamble II generator are being evaluated with several different diagnostics. An intense 1- to 2-MeV ion beam is extracted from the diode through a 2-{micro}m thick Kimfol and transported up to 2.2 m in 1-Torr air. Uniformity of ion emission from the polyethylene anode and ion-beam divergence are determined with a multiple pinhole camera located 0.5 m from the anode. Beam composition is determined with the Thomson parabola ion analyzer located about 2 m from the polyethylene anode in order to sample ions from the 10-cm-diam anode. The beam is primarily protons with a carbon fraction of < 1%. Beam fluence and pulse duration are determined by measuring protons Rutherford-scattered from small-area, thin, aluminum foils located at distances of 0.4 to 2.2 m from the anode. Scattered protons are detected with PIN diodes located at 90{degree} to the incident beam direction. Depth-dose measurements of the beam energy are made with a step wedge located 2.1 m from the diode. Proton transmissions through an array of 15 different-thickness aluminum filters are recorded on radiachromic film. Depth-dose profiles will be compared with energy depositions evaluated using electrical measurements in the diode.
- OSTI ID:
- 182758
- Report Number(s):
- CONF-950612--; ISBN 0-7803-2669-5
- Country of Publication:
- United States
- Language:
- English
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