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Assessing UV-Induced Degradation in Bifacial Modules of Different Cell Technologies

Conference ·
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Bifacial technology enables solar cells to offer higher power output and lower levelized cost of energy compared to their monofacial counterparts. Here, we examined the adverse effects of ultraviolet-induced degradation (UVID) on a variety of high-efficiency silicon wafer-based bifacial cell technologies, including silicon heterojunction (SHJ), interdigitated back contact (IBC), passivated emitter rear contact (PERC), and passivated emitter rear totally-diffused (PERT). Both the front and rear sides of bifacial cells without any encapsulation were exposed to an artificially accelerated UV exposure test. After 2000 h of UV irradiation, the bifacial cells exhibited greater power loss with backside exposure indicating potential sensitivity of the rear passivation to UV. The highest power degradation is observed in SHJ cells, followed by p-PERC and n-PERT cell technologies. The degradation in SHJ cells is attributed to the reduction in V oc and FF, while the degradation in p-PERC and n-PERT cells is correlated with a significant drop in I sc . This suggests that each cell type/make degrades via different degradation pathways.
Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S), Durable Modules Materials Consortium (DuraMAT)
DOE Contract Number:
AC36-08GO28308
OSTI ID:
1826305
Report Number(s):
NREL/CP-5900-80265; MainId:42468; UUID:74a5f936-6dea-4663-b0ed-7bf32dfb115e; MainAdminID:63196
Country of Publication:
United States
Language:
English

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Related Subjects

SOLAR ENERGY
UV photons
bifacial cells
bifacial technology
silicon wafer-based bifacial cell
ultraviolet-induced degradation