Simplified feedback control system for scanning tunneling microscopy

Martín-Vega, Francisco; Barrena, Víctor; Sánchez-Barquilla, Raquel; Fernández-Lomana, Marta; Benito Llorens, José; Wu, Beilun; Fente, Antón; Perconte Duplain, David; Horcas, Ignacio; López, Raquel; Blanco, Javier; Higuera, Juan Antonio; Mañas-Valero, Samuel; Jo, Na Hyun; Schmidt, Juan; Canfield, Paul C.; Rubio-Bollinger, Gabino; Rodrigo, José Gabriel; Herrera, Edwin; Guillamón, Isabel; Suderow, Hermann

doi:10.1063/5.0064511

Title: Simplified feedback control system for scanning tunneling microscopy

Journal Article · Mon Oct 11 00:00:00 EDT 2021 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/5.0064511· OSTI ID:1825138

;

; Benito Llorens, José;

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; López, Raquel; Blanco, Javier;

;

; Schmidt, Juan;

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A Scanning Tunneling Microscope (STM) is one of the most important scanning probe tools available to study and manipulate matter at the nanoscale. In a STM, a tip is scanned on top of a surface with a separation of a few Å. Often, the tunneling current between the tip and the sample is maintained constant by modifying the distance between the tip apex and the surface through a feedback mechanism acting on a piezoelectric transducer. This produces very detailed images of the electronic properties of the surface. The feedback mechanism is nearly always made using a digital processing circuit separate from the user computer. Here, we discuss another approach using a computer and data acquisition through the universal serial bus port. We find that it allows successful ultralow noise studies of surfaces at cryogenic temperatures. We show results on different compounds including a type II Weyl semimetal (WTe2), a quasi-two-dimensional dichalcogenide superconductor (2H–NbSe2), a magnetic Weyl semimetal (Co3Sn2S2), and an iron pnictide superconductor (FeSe).

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Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-07CH11358

OSTI ID:: 1825138

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Vol. 92 Journal Issue: 10; ISSN 0034-6748

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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