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SIMS and HR-XPS characterization of lithiated graphite from the magnetic fusion device RFX-mod

Journal Article · · Applied Surface Science
 [1];  [2];  [3];  [1];  [4];  [4];  [2]
  1. Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
  2. Princeton Univ., NJ (United States)
  3. Consorzio RFX, Padova (Italy)
  4. Consiglio Nazionale delle Ricerche (CNR), Padova (Italy). Condensed Matter Chemistry and Technologies for Energy (ICMATE)
Lithium wall conditioning has improved the performance of many magnetic fusion devices. Li conditioning in the RFX-mod device was performed by: (1) a single Li pellet injector and (2) a multi-Li pellet injector during He plasma discharges; (3) a Li evaporator after He glow discharge cleaning and He plasma discharge exposure. This report compares the spatial and depth distributions of Li deposited on polycrystalline graphite witness samples at different locations in RFX-mod and the elemental and chemical compositions of the resulting surfaces. The sample surfaces were analyzed ex situ using secondary ion mass spectrometry (SIMS) and high-resolution X-ray photoelectron spectroscopy (HR-XPS). The results showed that Li pellet injection provided a relatively uniform toroidal coverage while Li evaporation produced highly localized Li deposition. A Li 1s HR-XPS peak at 56.5 eV binding energy (BE) characteristic of lithium-intercalated graphite was only observed with the sample exposed to Li evaporation. All of the samples exhibited a HR-XPS C 1s peak at 285.1–285.2 eV BE that is largely attributed to hydrogenated graphite. This finding suggests that hydrogenation of fresh graphite occurs during He plasma discharge exposures. Finally, our results have implications for density control and the selection of Li conditioning techniques in magnetic fusion devices.
Research Organization:
Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC02-09CH11466
OSTI ID:
1822193
Journal Information:
Applied Surface Science, Journal Name: Applied Surface Science Vol. 567; ISSN 0169-4332
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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